Onishi, Y. ; Sato, Y. ; Shiobara, E. ; Miyoshi, S. ; Matsuyama, H. ; Abe, J. ; Ichinose, H. ; Ohiwa, T. ; Nakano, Y. ; Yoshikawa, S. ; Hayase, S.
Pub. info.:
Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.205-213, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gas-phase and surface chemistry in electronic materials processing : symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.. pp.135-, 1994. Pittsburgh, PA. MRS - Materials Research Society
Matsuyama, H. ; Okamura, Y. ; Kasahara, M. ; Yoshida, S. ; Tange, Y.
Pub. info.:
Enabling sensor and platform technologies for spaceborne remote sensing : 9-10 November 2004, Honolulu, Hawaii, USA. pp.115-125, 2005. Asia-Pacific Environmental Remote Sensing. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Okamura, Y. ; Matsuyama, H. ; Kasahara, M. ; Yoshida, S. ; Tange, Y.
Pub. info.:
Enabling sensor and platform technologies for spaceborne remote sensing : 9-10 November 2004, Honolulu, Hawaii, USA. pp.105-114, 2005. Asia-Pacific Environmental Remote Sensing. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yoshida, S. ; Matsuyama, H. ; Okamura, Y. ; Tomii, N. ; Tange, Y. ; Moriyama, M. ; Ogata, Y.
Pub. info.:
Multispectral and hyperspectral remote sensing instruments and applicaionts :25-27 October 2002, Hangzhou, China. pp.51-56, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kimachi, A. ; Ikuta, H. ; Fujiwara, Y. ; Matsuyama, H.
Pub. info.:
Sensors and camera systems for scientific, industrial, and digital photography applications IV : 21-23 January, 2003, Santa Clara, California, USA. pp.128-135, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering