1.

Conference Proceedings

Conference Proceedings
Mihara,T. ; Kawai,N. ; Yoshida,A. ; Sakurai,I. ; Kamae,T. ; Matsuoka,M. ; Shirasaki,Y. ; Sugizaki,M. ; Yuan,W.M. ; Tanaka,I.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XII : 31 July and 2 August 2001 San Diego, USA.  pp.173-186,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4497
2.

Conference Proceedings

Conference Proceedings
Miyata,E. ; Natsukari,C. ; Kamazuka,T. ; Kouno,H. ; Tsunemi,H. ; Matsuoka,M. ; Tomida,H. ; Ueno,S. ; Hamaguchi,K. ; Tanaka,I.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XII : 31 July and 2 August 2001 San Diego, USA.  pp.11-18,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4497
3.

Conference Proceedings

Conference Proceedings
Sakurai,I. ; Mihara,T. ; Kawai,N. ; Yoshida,A. ; Shirasaki,Y. ; Matsuoka,M. ; Sugizaki,M. ; Kamae,T.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.511-519,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
4.

Conference Proceedings

Conference Proceedings
Tomida,H. ; Matsuoka,M. ; Ueno,S. ; Torii,K. ; Sugizaki,M. ; Yuan,W.M. ; Komatsu,S. ; Shirasaki,Y. ; Kawai,N. ; Yoshida,A. ; Mihara,T. ; Sakurai,I. ; Negoro,H. ; Tsunemi,H. ; Yamauchi,M. ; Tanaka,I.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.178-185,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
5.

Conference Proceedings

Conference Proceedings
Shirasaki,Y. ; Kawai,N. ; Yoshida,A. ; Matsuoka,M. ; Namiki,M. ; Sakurai,I. ; Yamauchi,M. ; Takagishi,K. ; Hatsukade,I. ; Fenimore,E.E. ; Galassi,M.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.166-177,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
6.

Conference Proceedings

Conference Proceedings
Miyata,E. ; Natsukari,C. ; Akutsu,D. ; Ohtani,M. ; Tsunemi,H. ; Matsuoka,M. ; Kawai,N.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.186-193,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
7.

Conference Proceedings

Conference Proceedings
Matsuoka,M. ; Anpo,M.
Pub. info.: Catalysis by Unique Metal Ion Structures in Solid Matrices : From Science to Application.  pp.249-262,  2001.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 13
8.

Conference Proceedings

Conference Proceedings
Tomida,H. ; Matsuoka,M. ; Torii,K. ; Ueno,S. ; Sugizaki,M. ; Yuan,W.M. ; Shirasaki,Y. ; Sakano,M. ; Komatsu,S. ; Tsunemi,H. ; Miyata,E. ; Kawai,N. ; Yoshida,A. ; Mihara,T.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.304-312,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
9.

Conference Proceedings

Conference Proceedings
Shiraga,H. ; Heya,M. ; Fujioka,S. ; Miyanaga,N. ; Matsuoka,M. ; Azechi,H. ; Yamanaka,T.
Pub. info.: 24th International Congress on High-Speed Photography and Photonics : 24-29 September 2000, Sendai, Japan.  pp.339-350,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4183
10.

Conference Proceedings

Conference Proceedings
Taguchi,A. ; Takahei,K. ; Matsuoka,M. ; Tohno,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1491-1496,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263