X-ray, and gamma-ray instrumentation for astronomy XII : 31 July and 2 August 2001 San Diego, USA. pp.173-186, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray, and gamma-ray instrumentation for astronomy XII : 31 July and 2 August 2001 San Diego, USA. pp.11-18, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA. pp.511-519, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.178-185, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.166-177, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.186-193, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA. pp.304-312, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
24th International Congress on High-Speed Photography and Photonics : 24-29 September 2000, Sendai, Japan. pp.339-350, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1491-1496, 1997. Zurich, Switzerland. Trans Tech Publications