1.

Conference Proceedings
Conference Proceedings
1. GLASS TRASITION SINGULARITIES AND SLOW RELAXATION
Odagaki, T. ; Matsui, J. ; Hiwatari, Y.
Pub. info.: Fractal aspects of materials : symposium held November 28-December 1, 1994, Boston, Massachusetts, U.S.A..  pp.337-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 367
2.

Conference Proceedings
Conference Proceedings
2. A Unified Theory for the Glass Transition Dynamics and Its Singularities
Odagaki, T. ; Matsui, J. ; Fujisaki, M. ; Higuchi, M.
Pub. info.: Structure and dynamics of glasses and glass formers : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.163-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 455
3.

Conference Proceedings
Conference Proceedings
3. Separation of Diffusive Jump Motion and Trapped Motion of Atoms in a Glass-Forming Process Via Molecular-Dynamics Simulation
Matsui, J. ; Fujisaki, M. ; Odagaki, T.
Pub. info.: Structure and dynamics of glasses and glass formers : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.285-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 455
4.

Conference Proceedings
Conference Proceedings
4. Measurement of Local Strain in Semiconductor Materials by Using Synchrotron X-Ray Microbeam
Matsui, J. ; Tsusaka, Y. ; Kagoshima, Y. ; Yokoyama, K.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.467-478,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
5.

Conference Proceedings
Conference Proceedings
5. *DEGRADATION BEHAVIOR OF OPTO-ELECTRONIC DEVICES
Matsui, J.
Pub. info.: Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.477-490,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 14
6.

Conference Proceedings
Conference Proceedings
6. Molecular Orientation and Motion of Pyrene Molecules at the Interface of Polymer LB Films
Matsui, J. ; Mitsuishi, M. ; Miyashita, T.
Pub. info.: Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan.  pp.573-576,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 132
7.

Conference Proceedings
Conference Proceedings
7. Recent Progress on InP HBT Technology and Applications
Gutierrez-Aitken, A. ; Sawdai, D. ; Chang, P. ; Monier, C. ; V. Gambin, A. ; Barsky, Cavus.M. ; Oyama, B. ; Matsui, J. ; Tsai, K. ; Chan, B. ; Oki, A. K.
Pub. info.: State-of-the-art program on compound semiconductors XLI and nitride and wide bandgap semiconductors for sensors, photonics, and electronics V : proceedings of the international symposia.  pp.1-11,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-06
8.

Conference Proceedings
Conference Proceedings
8. Local strain measurement by synchrotron X-ray microbeam
Matsui, J. ; Tsusaka, Y. ; Yakoyama, K. ; Takeda, S. ; Urakawa, M. ; Kagoshimna, Y. ; Kimura, S.
Pub. info.: Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany.  pp.123-132,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-29
9.

Conference Proceedings
Conference Proceedings
9. Measurement of Local Strain in Semiconductor Materials by Using Synchrotron X-Ray Microbeam
Matsui, J. ; Tsusaka, Y. ; Kagoshima, Y. ; Yokoyama, K.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.467-478,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3
10.

Conference Proceedings
Conference Proceedings
10. Comparison of Direct Numerical Procedure and Monte Carlo Technique to Determine the Charging Effects in Submicron Structures
Petrovic, Z.Lj. ; Sakadzic, S. ; Spasojevic, N. ; Matsui, J. ; Makabe, T.
Pub. info.: Progress in advanced materials and processes, YUCOMAT V : proceedings of the fifth Yugoslav Materials Research Society, held at Herceg - Novi, Serbia and Montenegro, September 15-19, 2003.  pp.9-14,  2004.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 453-454