1.

Conference Proceedings

Conference Proceedings
Olivares, J. ; Martin, P. ; Rodriguez, A. ; Sangrador, J. ; Martinez, O. ; Jimenez, J. ; Rodriguez, T.
Pub. info.: Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.221-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 588
2.

Conference Proceedings

Conference Proceedings
Martinez, O. ; Jimenez, J. ; Martin, P. ; Chambonnet, D. ; Degoy, S. ; Belouet, C.
Pub. info.: Epitaxial oxide thin films II : symposium held November 26-30, 1995, Boston, Massachusetts, U.S.A..  pp.405-410,  1996.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 401
3.

Conference Proceedings

Conference Proceedings
Ardila, Angel M. ; Martinez, O. ; Avella, M. ; Jimenez, J. ; Gerard, B. ; Napierala, J. ; Gil-Lafon, E.
Pub. info.: Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.  pp.417-422,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 692
4.

Conference Proceedings

Conference Proceedings
Ardila, Angel M. ; Martinez, O. ; Avella, M. ; Sanz, Luis F. ; Jimenez, J. ; Gerard, B. ; Napierala, J. ; Gil-Lafon, E.
Pub. info.: Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.79-168,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 738
5.

Conference Proceedings

Conference Proceedings
Martinez, O. ; Avella, M. ; Jimenez, J. ; Gerard, B. ; Galloway, S.
Pub. info.: Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.91-192,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 738
6.

Conference Proceedings

Conference Proceedings
Attolini, G. ; Fallini, P. ; Germini, F. ; Pelosi, C. ; Martinez, O. ; Sanz, L.F. ; Gonzalez, M.A. ; Jimenez, J.
Pub. info.: Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.  pp.91-98,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 692
7.

Conference Proceedings

Conference Proceedings
Leventouri, Th. ; Moghaddam, H. Y. ; Papanearchou, N. ; Bunaciu, C. E. ; Levinson, R. L. ; Martinez, O.
Pub. info.: Mineralization in natural and synthetic biomaterials : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.79-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 599
8.

Technical Paper

Technical Paper
Martinez, O. ; Kargar, K.
Pub. info.: 2000 SAE world congress : technical paper.  2000.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2000
9.

Conference Proceedings

Conference Proceedings
Farnand, S. ; Topfer, K. ; Kress, W. C. ; Martinez, O. ; McCarthy, A. L. ; Shin, H. H. ; Zeise, E. K. ; Gusev, D.
Pub. info.: Image Quality and System Performance II.  pp.157-162,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5668
10.

Conference Proceedings

Conference Proceedings
Cookingham, R. ; Dalal, E.N. ; Farnand, S. ; Gusev, D. ; Kress, W.C. ; Martinez, O. ; McCarthy, A. ; Topfer, K. ; Zeise, E.K.
Pub. info.: Image Quality and System Performance.  pp.55-59,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5294