1.

Conference Proceedings

Conference Proceedings
Hepplewhite,C.L. ; Johnson,E.A. ; Loh,J. ; Martin,N. ; Morris,N. ; Richard,S.P.
Pub. info.: Sensors, systems, and next-generation satellites V : 17-20 September 2001, Toulouse, France.  pp.16-26,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4540
2.

Conference Proceedings

Conference Proceedings
Martin,N. ; Harkin-Jones,E.M. ; Martin,P.J.
Pub. info.: ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002.  1  pp.732-736,  2002.  Brookfield, Conn..  Society of Plastic Engineers.
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 60
3.

Conference Proceedings

Conference Proceedings
Martin,N. ; Rousselot,Ch.
Pub. info.: Trends and new applications of thin films : proceedings of the 6th International Symposium on Trends and New Applications of Thin Films (TATF '98), Regensburg, Germany, March 1998.  pp.401-404,  1998.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 287-288
4.

Conference Proceedings

Conference Proceedings
Martin,N. ; Madjoud,H. ; Baretti,D. ; Rousselot,C.
Pub. info.: Trends and new applications of thin films : proceedings of the 6th International Symposium on Trends and New Applications of Thin Films (TATF '98), Regensburg, Germany, March 1998.  pp.327-330,  1998.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 287-288
5.

Conference Proceedings

Conference Proceedings
Pain,L. ; Trouiller,Y. ; Barberet,A. ; Guirimand,O. ; Fanget,G.L. ; Martin,N. ; Quere,Y. ; Nier,M.E. ; Lajoinie,E. ; Louis,D. ; Heitzmann,M. ; Scheiblin,P. ; Toffoli,A.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.96-107,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
6.

Conference Proceedings

Conference Proceedings
Martin,N. ; Amato,M. ; Buchko,M. ; Farley,R. ; Frigaard,M. ; Generie,J. ; McGinnis,M. ; Kristensen,R. ; Polny,J. ; Dame,R.
Pub. info.: Space telescopes and instruments IV : 6-7 August 1996, Denver, Colorado.  pp.86-97,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2807
7.

Conference Proceedings

Conference Proceedings
Strickland,N.H. ; Allison,D.J. ; Beam,K.W. ; Deshaies,M.J. ; Fitzpatrick,M. ; Gardener,G. ; Martin,N. ; Phillp,J. ; Prenzno,T.W. ; Turner,J.E. ; West,M.
Pub. info.: Medical Imaging 1998: PACS Design and Evaluation: Engineering and Clinical Issues.  pp.496-499,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3339