Sensors, systems, and next-generation satellites V : 17-20 September 2001, Toulouse, France. pp.16-26, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Trends and new applications of thin films : proceedings of the 6th International Symposium on Trends and New Applications of Thin Films (TATF '98), Regensburg, Germany, March 1998. pp.401-404, 1998. Aedermannsdorf, Switzerland. Trans Tech Publications
Trends and new applications of thin films : proceedings of the 6th International Symposium on Trends and New Applications of Thin Films (TATF '98), Regensburg, Germany, March 1998. pp.327-330, 1998. Aedermannsdorf, Switzerland. Trans Tech Publications
Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.96-107, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Space telescopes and instruments IV : 6-7 August 1996, Denver, Colorado. pp.86-97, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Medical Imaging 1998: PACS Design and Evaluation: Engineering and Clinical Issues. pp.496-499, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering