1.

Conference Proceedings
Conference Proceedings
1. Electrical characterization ofelectron beam induced defects in epitaxially grown Si1-xGex
Mamor,M. ; Auret,F.D. ; Goodman,S.A. ; Myburg,G. ; Deenapanray,P.N.K. ; Meyer,W.E.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.115-120,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Electronic properties of defects introduced in n- and p-type Si1-xGex during ion etching
Goodman,S.A. ; Auret,F.D. ; Mamor,M. ; Deenapanray,P.N.K. ; Meyer,W.E.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.133-138,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263