1.

Conference Proceedings

Conference Proceedings
Yasuno, Y. ; Sugisaka, J. ; Sando, Y. ; Nakamura, Y. ; Makita, S. ; Endo, T. ; Itoh M ; Yatagai T
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine X : 23-25 January 2006, San Jose, California, USA.  pp.607918-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6079
2.

Conference Proceedings

Conference Proceedings
Yasuno, Y ; Madjarova, V. D. ; Makita, S. ; Akiba, M ; Morosawa, A ; Chong, C ; Sakai, T ; Chan, K. P ; Ltoh, M ; Yatagai, T
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine X : 23-25 January 2006, San Jose, California, USA.  pp.60790W-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6079
3.

Conference Proceedings

Conference Proceedings
Madjarova, V. D. ; Yasuno, Y. ; Makita, S. ; Hori Y ; Voeffray J B ; Itoh M ; Yatagai, T ; Tamura, M. ; Nanbu, T.
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine X : 23-25 January 2006, San Jose, California, USA.  pp.60790N-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6079
4.

Conference Proceedings

Conference Proceedings
Yasuno, Y. ; Sugisaka, J. ; Sando, Y. ; Makita, S. ; Endo, T. ; Itoh, M. ; Yatagai, T.
Pub. info.: Optical coherence tomography and coherence techniques II : 12-16 June 2005, Munich, Germany.  pp.58610A-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5861
5.

Conference Proceedings

Conference Proceedings
Yamanari, M. ; Yasuno, Y. ; Makita, S. ; Nakamura, Y. ; Hori, Y ; Itoh, M ; Yatagai, T
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine X : 23-25 January 2006, San Jose, California, USA.  pp.60792A-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6079
6.

Conference Proceedings

Conference Proceedings
Yasuno, Y. ; Makita, S. ; Endo, T. ; Itoh, M. ; Yatagai, T.
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine VIII : 26-28 January 2004, San Jose, California, USA.  pp.306-313,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5316
7.

Conference Proceedings

Conference Proceedings
Yasuno, Y. ; Makita, S. ; Endo, T. ; Aoki, G. ; Itoh, M. ; Yatagai, T.
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine IX : 23-26 January 2005, San Jose, California, USA.  pp.137-142,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5690
8.

Conference Proceedings

Conference Proceedings
Endo, T. ; Yasuno, Y. ; Truffer, F. ; Aoki, G. ; Makita, S. ; Itoh, M. ; Yatagai, T.
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine IX : 23-26 January 2005, San Jose, California, USA.  pp.168-173,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5690
9.

Conference Proceedings

Conference Proceedings
Makita, S. ; Yasuno, Y. ; Endo, T. ; Aoki, G. ; Itoh, M. ; Yatagai, T.
Pub. info.: Coherence domain optical methods and optical coherence tomography in biomedicine IX : 23-26 January 2005, San Jose, California, USA.  pp.127-131,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5690
10.

Conference Proceedings

Conference Proceedings
Yasuno, Y. ; Makita, S. ; Endo, T. ; Aoki, G. ; Yamanari, M. ; Nakamura, Y. ; Itoh, M. ; Yatagai, T.
Pub. info.: Optical Measurement Systems for Industrial Inspection IV.  pp.307-311,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5856