1.

Conference Proceedings

Conference Proceedings
Aichele,N. ; Gommel,U. ; K.Laヲツmann ; Maier,F. ; Zeller,F. ; Haller,E.E. ; Itoh,K.M. ; Khirunenko,L.I. ; Shakhovtsov,V.I. ; Pajot,B. ; Fogarassy,E. ; Mtissig,H.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.47-52,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Hollering,M. ; Mattem,B. ; Maier,F. ; Ley,L. ; Stampfl,A.P.J. ; Xue,J. ; Riley,J.D. ; Leckey,R.C.G.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.331-334,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings

Conference Proceedings
Maier,F. ; Eilenberger,R. ; Beck,W. ; Lassmann,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.219-224,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201