1.

Conference Proceedings

Conference Proceedings
Murakami,Y. ; Maeda,S. ; Takahashi,A. ; Tanaka,Y. ; Watanabe,T.
Pub. info.: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  pp.69-71,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3864
2.

Conference Proceedings

Conference Proceedings
Nakamura,K. ; Maeda,S. ; Togawa,S. ; Saishoji,T. ; Tomioka,J.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.31-43,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
3.

Conference Proceedings

Conference Proceedings
Shindo,Y. ; Yazawa,M. ; Izuka,M. ; Aoyama,H. ; Kinnbara,M. ; Maeda,S.
Pub. info.: Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland.  pp.66-87,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3094
4.

Conference Proceedings

Conference Proceedings
Murakami,Y. ; Numata,T. ; Ogata,N. ; Takamori,N. ; Maeda,S. ; Takahashi,A. ; Tanaka,Y. ; Muto,Y. ; Nishida,M. ; Kanno,M. ; Nakaoki,A. ; Fujiie,K.
Pub. info.: Optical data storage 2001 : 22-25 April 2001 Santa Fe, USA.  pp.252-259,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4342