1.

Conference Proceedings
Conference Proceedings
1. XRD analysis of TRAM composed from [Sb2Te3/GeTe] superlattice film and its switching characteristics
T. Ohyanagi ; M. Kitamura ; S. Kato ; M. Araidai ; N. Takaura
Pub. info.: Materials and technology for nonvolatile memories : symposium held November 30-December 5, 2014, Boston, Massachusetts. U.S.A..  pp.41-46,  2015.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1729
2.

Conference Proceedings
Conference Proceedings
2. Residual Stress Measurement Of High Molecular Matter By Transmission X-Ray Diffraction
M. Kitamura ; M. Nishida ; T. Hanabusa
Pub. info.: Residual stresses VIII : selected, peer reviewed papers from the 8th European Conference on Residual Stresses, ECRS8, 2010, June 26-28, 2010, Riva del Garda, Italy.  pp.381-386,  2011.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 681
3.

Technical Paper
Technical Paper
3. Study on Flapping-of-Wings Flight of Butterfly with Numerical and Experimental Analysis
K. Senda ; M. Sawamoto ; T. Shibahara ; M. Kitamura ; T. Tanaka
Pub. info.: AIAA meeting papers on disc.  2006.  Reston, Va.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Atmospheric Flight Mechanics Conference
Ser. no.: 2006
4.

Technical Paper
Technical Paper
4. Topology Optimization for Force Sensor Structure Based on Singular Value Decomposition
A. Takezawa ; S. Nishiwaki ; M. Kitamura ; E. Silva
Pub. info.: AIAA meeting papers on disc.  2008.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Multidisciplinary Analysis and Optimization Conference
Ser. no.: 2008
5.

Conference Proceedings
Conference Proceedings
5. Quality evaluation of Lippmann-type hologram using CGH
T. Yamauchi ; M. Kurashige ; T. Kumasawa ; M. Kitamura ; M. Watanabe
Pub. info.: Practical holography XXII : materials and applications : 20-23 January 2008, San Jose, California, USA.  pp.691218-1-691218-11,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6912