1.

Conference Proceedings
Conference Proceedings
1. The Low Leakage Current Density of MIS with SiO₂ Film Made by ICP-CVD
Y. Lu ; S. Tsai ; M. Hon
Pub. info.: Dielectrics for nanosystems II: materials science, processing, reliability, and manufacturing.  pp.261-266,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(1)
2.

Conference Proceedings
Conference Proceedings
2. Inhibition of Oxygen Reduction on Copper in Neutral Sodium Chloride
M. Kendig ; M. Hon ; J. Sinko
Pub. info.: Corrosion protective coatings and inhibitors : at the 208th ECS Meeting, October 16-21, 2005, Los Angeles, California, USA.  pp.119-132,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(9)