1.

Conference Proceedings
Conference Proceedings
1. Image enhancement for phase shift analysis sensors
G. Abramovich ; K. Harding ; R. Isaacs ; M. Radebach ; K. Kenny ; Z. Sun ; J. Ross ; M. Jia ; L. Tao ; G. Song ; J. Zheng ; M. Gardner ; D. Padfield
Pub. info.: Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA.  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6382
2.

Conference Proceedings
Conference Proceedings
2. Elfect of Deposition Sequence and Plasma Treatment on ALCVD HfO2 n-MOSFET Properties
C. Lim ; Y. Kim ; A. Hou ; J. Gutt ; S. Marcus ; C. Pomarede ; E. Shero ; H. de Waard ; C. Werkhoven ; L. Chen ; J. Tamim ; N. Chaudhary ; G. Bersuker ; J. Barnett ; C. Young ; P. Zeitzoff ; G. A. Brown ; M. Gardner ; R. W. Murto ; H. R. Huff
Pub. info.: Physicas and technology of high-k gate dielectrics : proceedings of the International Symposium on High Dielectric Constant Materials : Materials Science, Processing, and Reliability, and Manufacturing Issues.  pp.83-92,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-28
3.

Conference Proceedings
Conference Proceedings
3. Improved Scalability of High-K Gate Dielectrics by using Hf-Aluminates
T. H. Hou ; J. Gutt ; C. Lim ; S. Marcus ; C. Pomarede ; E. Shera ; H. de Warrd ; C. Werkhoven ; M. Gardner ; R. W. Murto ; H. R. Huff
Pub. info.: Physicas and technology of high-k gate dielectrics : proceedings of the International Symposium on High Dielectric Constant Materials : Materials Science, Processing, and Reliability, and Manufacturing Issues.  pp.141-148,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-28
4.

Conference Proceedings
Conference Proceedings
4. Sub 2 nm Thick Zirconjism Doped Hafnium Oxide High-K Gate Dielectrics
Y. Kuo ; J. Lu ; J. Yan ; T. Yuan ; H. Kim ; J. Peterson ; M. Gardner ; S. Chatterjee ; W. Luo
Pub. info.: Physics and technology of high-k gate dielectrics III.  pp.447-454,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(5)
5.

Technical Paper
Technical Paper
5. From Small X to Large X: Assessment of Space-Filling Criteria for the Design and Analysis of Computer Experiments
M. Gardner ; V. Ramanath ; P. Ayyalasomayajula ; A. Patterson
Pub. info.: AIAA meeting papers on disc.  2006.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.: 2006