1.

Conference Proceedings
Conference Proceedings
1. SNR improvement of digital speckle pattern interferograms
F. Garoi ; A. Sima ; D. Apostol ; V. Damian ; P. C. Logofatu ; V. Nascov ; I. Iordache ; L. Serghei ; M. Bojan
Pub. info.: Advanced laser technologies 2006 : 8-12 September 2006, Brasov, Romania.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6606
2.

Conference Proceedings
Conference Proceedings
2. Optical encoder measurement technology
I. Iordache ; M. Bojan ; D. Apostol ; V. Damian ; F. Garoi ; P. C. Logofaetu ; R. Muller ; B. Savu
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies III : 24-26 November 2006, Bucharest, Romania.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6635
3.

Conference Proceedings
Conference Proceedings
3. Nanometrology of microsystems: traceability problem in nanometrology
I. Iordache ; D. Apostol ; O. Iancu ; G. Stanciu ; P. C. Logofatu ; V. Damian ; F. Garoi ; B. Savu ; M. Bojan
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies III : 24-26 November 2006, Bucharest, Romania.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6635
4.

Conference Proceedings
Conference Proceedings
4. Magnetic liquid surface behaviour to external stimulus
V. Damian ; P. C. Logofatu ; D. Apostol ; L. Vekas ; D. Bica ; A. Damian ; F. Garoi ; I. Iordache ; A. Sima ; M. Bojan
Pub. info.: ROMOPTO 2006 : eighth conference on optics : 4-7 September 2006, Sibiu, Romania.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6785
5.

Conference Proceedings
Conference Proceedings
5. Refractive index measurement using comparative interferometry
M. Bojan ; D. Apostol ; V. Damian ; P. C. Logofatu ; F. Garoi ; I. Iordache
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies III : 24-26 November 2006, Bucharest, Romania.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6635
6.

Conference Proceedings
Conference Proceedings
6. Time-averaged vibration mode viewing with DSPI
F. Garoi ; D. Apostol ; A. Sima ; V. Damian ; P. C. Logofatu ; V. Nascov ; I. Iordache ; M. Bojan
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies III : 24-26 November 2006, Bucharest, Romania.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6635
7.

Conference Proceedings
Conference Proceedings
7. Structure modeling for scatterometric characterization of photoinduced surface-relief gratings
P. C. Logofatu ; I. Apostol ; M. Castex ; V. Damian ; I. Iordache ; M. Bojan ; D. Apostol
Pub. info.: Modeling aspects in optical metrology : 18-19 June 2007, Munich, Germany.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6617
8.

Conference Proceedings
Conference Proceedings
8. White light interferometry for vertical artifact calibration
V. Damian ; M. Bojan ; A. Sima ; D. Cristea ; A. Dinescu
Pub. info.: INDLAS 2007 : industrial laser applications : 23-25 May 2007, Bran, Romania.  pp.70070J-1-70070J-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7007
9.

Conference Proceedings
Conference Proceedings
9. White light interferometry applications in nanometrology
V. Damian ; M. Bojan ; P. Schiopu ; I. lordache ; B. lonita
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies IV : 28-31 November 2008, Constanta, Romania.  pp.72971H-1-72971H-4,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7297