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Environmental monitoring and remediation III : 28-30 October 2003, Providence, Rhode Island, USA. pp.133-139, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Rumyantsev, S. L. ; Sawyer, S. ; Pala, N. ; Shur, M. S. ; Bilenko, Yu. ; Zhang, J. P. ; Hu, X. ; Lunev, A. ; Deng, J. ; Gaska, R.
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Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA. pp.75-85, 2005. Bellingham, Washington. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Vitta, P. ; Kuril-k, N. ; Jur-enas, S. ; -ukauskas, A. ; Bakiene, E. ; Zhang, J. ; Katona, T. ; Bilenko, Y. ; Lunev, A. ; Hu, X. ; Deng, J. ; Gaska, R.
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Optically Based Materials and Optically Based Biological and Chemical Sensing for Defence II. pp.59900X-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering