1.

Conference Proceedings
Conference Proceedings
1. Deep Levels in Silicon as a Result of CoSi2 Formation
Lu,L.W. ; Groeseneken,G. ; Hove,L.Van den ; Maex,K.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.183-188,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
2.

Conference Proceedings
Conference Proceedings
2. First Observation of a Metastable Charaeter of Irradiation-Induced Defects in GaAs-GaAlAs Superlattices
Feng,S.L. ; Zhou,J. ; Lu,L.W.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1047-1050,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Plasma diagnostics in KrF excimer laser deposition of Ti thin films
Hong,M.H. ; Lu,Y.F. ; Ho,T.M. ; Lu,L.W. ; Low,T.S.
Pub. info.: Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China.  pp.441-449,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3550
4.

Conference Proceedings
Conference Proceedings
4. KrF excimer laser deposition of titanium thin films on silicon substrates
Lu,L.W. ; Lu,Y.F. ; Hong,H. ; Ho,T.M. ; Low,T.S.
Pub. info.: Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China.  pp.110-119,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3550