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Conference Proceedings

1. Stability of the gate-dielectric/a-Si: H interface with hydrogen plasma treatment

Lu,I.-M. ; Chen,Y.-E. ; Huang,T.-H. ; Lin,H.-C.

Pub. info.:	Display technologies II : 9-11 July 1998, Taipei, Taiwan. pp.163-167, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3421

Conference Proceedings

2. Influence of the deposition of PECVD hydrogenated silicon nitride on the transparency of an indium tin oxide underlayer

Lin,H.-C. ; Lu,I.-M.

Pub. info.:	Display technologies II : 9-11 July 1998, Taipei, Taiwan. pp.183-189, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3421

Conference Proceedings

3. Amorphous-silicon thin film transistor with two-step exposure process

Chen,P.-F. ; Chen,J.-H. ; Chen,D.-I. ; Sung,H.-J. ; Hwang,J.-W. ; Lu,I.-M.

Pub. info.:	Display technologies III : 26-27 July 2000, Taipei, Taiwan. pp.217-220, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4079