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20 results

Conference Proceedings

1. Model and algorithm for VHDL high-level and hierarchical simulation with debug function

Bian,J. ; Lu,F. ; Wan,B. ; Su,M.

Pub. info.:	Computer-aided design and computer graphics : Fourth International Conference on Computer-Aided Design and Computer Graphics : 23-25 October, 1995, Wuhan, China. pp.791-796, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2644

Conference Proceedings

2. Determining moisture content in a broad range of sawdust from microwave transmission measurement using microstrip line

Lu,F. ; Okamura,S.

Pub. info.:	Subsurface sensing Technologies and Application II : 31 July-3 August 2000, San Diego, USA. pp.82-87, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4129

Conference Proceedings

3. Conversion efficiency of double-clad fiber laser

Fu,C. ; Li,Y. ; Liu,W. ; Lu,F. ; Lu,K.

Pub. info.:	Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.160-163, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4225

Conference Proceedings

4. External-cavity laser diode tuned continuously in a large range by a grating

Guo,S. ; Lu,F. ; Ren,M. ; Jin,J. ; Wang,H. ; Zhang,G.

Pub. info.:	Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.116-120, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4220

Conference Proceedings

5. Narrow-linewidth tunable external-cavity semiconductor laser with Littman setup

Jin,J. ; Guo,S. ; Lu,F. ; Zhang,G.

Pub. info.:	Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.126-129, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4220

Conference Proceedings

6. Tunable FBG external-cavity laser diode at 1550 nm

Guo,S. ; Lu,F. ; Liu,Z. ; Fang,Y. ; Jin,J. ; Zhang,G.

Pub. info.:	Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.113-115, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4220

Conference Proceedings

7. Self-Q-switched Er-doped fiber laser

Lu,F. ; Fan,Y. ; Zhai,A. ; Guo,S. ; Wang,H. ; Lu,K.

Pub. info.:	Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.168-171, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4225

Conference Proceedings

8. Self-Q-switched double-cladding fiber laser based on SBS

Lu,F. ; Zhai,A. ; Fan,Y. ; Wang,H. ; Guo,S. ; Lu,K.

Pub. info.:	Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.172-175, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4225

Conference Proceedings

9. Characterization of multi-element CZT arrays

Cirignano,L.J. ; Shah,K.S. ; Bennett,P.R. ; Li,L. ; Lu,F. ; Buturlia,J. ; Yao,H.W. ; Wright,G.W. ; James,R.B.

Pub. info.:	Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA. pp.23-28, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4141

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Conference Proceedings

10. Picosecond optical sampling method to measure S-parameter of microwave monolithic integrated circuit

Lu,F. ; Yuan,S. ; Pan,J. ; Gai,Q. ; Zhao,Y. ; He,Q.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.595-600, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

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