1.

Conference Proceedings
Conference Proceedings
1. Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films
Losee, P. A. ; Li, C. ; Seiler, J. ; Stahlbush, R. E. ; Chow, T. P. ; Bhat, I. B. ; Gutmann, R. J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.961-964,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
2.

Conference Proceedings
Conference Proceedings
2. Characterization of 4H-SiC Epitaxial Layers by Microwave Photoconductivity Decay
Kumar, R. J. ; Losee, P. A. ; Li, C. ; Seiler, J. ; Bhat, I. B. ; Chow, T. P. ; Borrego, J. M. ; Gutmann, R. J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.405-408,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485