1.

Conference Proceedings
Conference Proceedings
1. Direct spectroscopic measurement of packaging-induced strains in high-power laser diode arrays
Tomm,J.W. ; Muller,R. ; Barwolff,A. ; Neuner,M. ; Elsaesser,T. ; Lorenzen,D. ; Daiminger,F.X. ; Gerhardt,A. ; Donecker,J.
Pub. info.: Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California.  pp.138-147,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3626
2.

Conference Proceedings
Conference Proceedings
2. Measurement of mounting-induced strain in high-power laser diode arrays
Tomm,J.W. ; Muller,R. ; Barwolff,A. ; Lorenzen,D.
Pub. info.: Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore.  pp.56-64,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3896
3.

Conference Proceedings
Conference Proceedings
3. Fiber-coupled diode laser systems up to 2-kW output power
Dorsch,F. ; Bluml,V. ; Schroder,M. ; Lorenzen,D. ; Hennig,P. ; Wolff,D.
Pub. info.: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.42-49,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3945
4.

Conference Proceedings
Conference Proceedings
4. High-power laser diodes,laser diode modules,and their applications
Daiminger,F.X. ; Dorsch,F. ; Lorenzen,D.
Pub. info.: Solid state lasers : Laser Optics '98 : 22-26 June 1998, St. Petersburg, Russia.  pp.13-23,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3682