1.

Conference Proceedings
Conference Proceedings
1. COMPARISON OF THE DENSITY AND DISTRIBUTION OF TRAPS GENERATED BY HIGH VOLTAGE STRESS IN SILICON OXIDE AND SILICON OXYNITRIDES
Richardson, J.T. ; Dumin, D.J. ; Lo, G.Q. ; Kwong, D.L. ; Gross, B.J. ; Sodini, C.G.
Pub. info.: Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A..  pp.357-362,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 284
2.

Conference Proceedings
Conference Proceedings
2. N2O-Based Gate Dielectrics for ULSI Applications
Kim, J. ; Yoon, G.W. ; Lo, G.Q. ; Ahn, J. ; Kwong, D.L.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.25-35,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1