1.

Conference Proceedings
Conference Proceedings
1. Multi-fin double-gate MOSFET fabricated by using (110)-oriented SOI wafers and orientation-dependent etching
Liu, V. ; Ishii, K. ; Tsutsumi, T. ; Masahara, M. ; Takashima, H. ; Suzuki, E.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.255-260,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
2.

Conference Proceedings
Conference Proceedings
2. Progress in high-power fiber lasers
Bhagavatula, V. ; Bhat, R. ; Berkey, G.E. ; Chen, X. ; Dejneka, M.J. ; Gallagher, M. ; Hughes, L.C. ; Koch, K.W. ; Koh, J. ; Li, M.J. ; Liu, V. ; Nolan, D.A. ; Rasmussen, H.M. ; Tennent, C.L. ; Venkataraman, N. ; Walton, D.T. ; Wang, J. ; Zah, C.E. ; Zenteno, L.A.
Pub. info.: Fiber lasers: technology, systems, and applications : 26-28 January, 2004, San Jose, California, USA.  pp.210-216,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5335
3.

Conference Proceedings
Conference Proceedings
3. 90-nm lithography process characterization using ODP scatterometry technology
Ke, C.-M. ; Yu, S.-S. ; Wang, Y.-H. ; Chou, Y.-J. ; Chen, J.-H. ; Lee, B.-H. ; Chu, H.-Y. ; Lin, H.-T. ; Gau, T.-S. ; Lin, C.-H. ; Ku, Y.-C. ; Lin, B.J. ; Huang, J. ; Hsu, J.J. ; Liu, V. ; Hetzer, D. ; Yap, L. ; Yang, W. ; Araki, K.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.597-604,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375