2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61503P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Yang, C. P. ; Wu, J. ; Qiu, R. ; Wang, X. D. ; Liu, M. ; Leng, J
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2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61504J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Annamalai, S. ; Dowd, P. ; Forman, D. ; Varangis, P. ; Tumolillo, T. ; Gray, A. ; Sun, K. ; Liu, M. ; Campbell, J. ; Carothers, D. ; Krishna. S.
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Photonics for space environments X : 1-2 August 2005, San Diego, California, USA. pp.58970P-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Xiong, J. ; Dai, W. ; Chen, L. ; Liu, G. ; Liu, M. ; Zhang, Z. ; Xiao, H.
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2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.615043-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Mathematics of Data/Image Pattern Recognition, Compression, and Encryption with Applications IX. pp.63150P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Zhang, J. ; Feng, W. ; Liu, M. ; Liu, Z. ; Nie, L.
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ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.60281P-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Scherer, N. F. ; Pelton, M. ; Jin, R. ; Jureller, J. E. ; Liu, M. ; Kim, H. Y. ; Park, S. ; Guyot-Sionnest, P.
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Plasmonics: Metallic Nanostructures and their Optical Properties IV. pp.632309-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Pelton, M. ; Liu, M. ; Kim, H. Y. ; Smith, G. ; Guyot-Sionnest, P. ; Scherer, N. F.
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Plasmonics: Metallic Nanostructures and their Optical Properties IV. pp.63230E-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering