1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF SINGLE AND POLYCRYSTALLINE SILICON BY EXTENSIONS OF THE ELYMAT TECHNIQUE
Foell, H. ; Lehmann, V. ; Lippik, W.
Pub. info.: Proceedings of the Satellite Symposium to ESSDERC 93 Grenoble/France : crystalline defects and contamination: their impact and control in device manufacturing.  pp.252-261,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-15
2.

Conference Proceedings
Conference Proceedings
2. MAPPING OF DEFECT RELATED SILICON BULK AND SURFACE PROPERTIES WITH THE ELYMAT TECHNIQUE
Carstensen, J. ; Lippik, W. ; Foell, H.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.1105-1116,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10