In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK. pp.49-56, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Process and equipment control in microelectronic manufacturing : 19-20 May 1999, Edinburgh, Scotland. pp.43-50, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical diagnostics for fluids/heat/combustion and photomechanics for solids : 21-23 July 1999, Denver, Colorado. pp.102-109, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of lasers in dentistry IV : 25-26 January 1998, San Jose, California. pp.173-181, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Smart structures and materials 2001 : Smart systems for bridges, structures, and highways : 5-7 March 2001, Newport Beach, USA. pp.313-322, 2001. Bellingham. SPIE-The International Society for Optical Engineering
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Visual communications and image processing '97 : 12-14 February 1997, San Jose, California. Part2 pp.1101-1108, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electrochemical methods in corrosion research : proceedings of the 3rd International Symposium, held in zürich, Switzerland, in July, 1988. pp.83-96, 1989. Aedemannsdorf, Switzerland. Trans Tech Publications
Proceedings of lasers in dentistry II : 28-29 January 1996, San Jose, California. pp.159-164, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering