1.

Conference Proceedings

Conference Proceedings
Lu,I.-M. ; Chen,Y.-E. ; Huang,T.-H. ; Lin,H.-C.
Pub. info.: Display technologies II : 9-11 July 1998, Taipei, Taiwan.  pp.163-167,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3421
2.

Conference Proceedings

Conference Proceedings
Lin,H.-C. ; Lu,I.-M.
Pub. info.: Display technologies II : 9-11 July 1998, Taipei, Taiwan.  pp.183-189,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3421
3.

Conference Proceedings

Conference Proceedings
Yew,J.-Y. ; Chen,L.-J. ; Nakamura,K. ; Chao,T.-S. ; Lin,H.-C.
Pub. info.: Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing VI : 11-13 March 1996, Santa Clara, California.  pp.180-188,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2723
4.

Conference Proceedings

Conference Proceedings
Chang,I-C. ; Chen,B.-T. ; Hsieh,K.-J. ; Hsueh,W.-J. ; Lin,H.-C.
Pub. info.: Input/Output and Imaging Technolgies II.  pp.21-28,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4080
5.

Conference Proceedings

Conference Proceedings
Chen,B.-T. ; Lou,W.-S. ; Chen,C.-C. ; Lin,H.-C.
Pub. info.: Input/Output and Imaging Technologies.  pp.99-107,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3422
6.

Conference Proceedings

Conference Proceedings
Huang,M.-F. ; Lee,H.-C. ; Ho,J.-K. ; Lin,H.-C. ; Cheng,C.-S. ; Kuo,C.-C. ; Kuo,Y.-K.
Pub. info.: Optoelectronic Materials and Devices.  pp.110-118,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3419