1.

Conference Proceedings
Conference Proceedings
1. Investigation of the Time - Delay Effect on the Critical Dimension of Tungsten Slilcide/Polysilicon Gate after Reactive Ion Etching
Lin, S-P. ; Ou, C-H. ; Lee, Sz. ; Tien, Y-C. ; Hsu, C-F.
Pub. info.: Plasma etching processes for sub-quarter micron devices : proceedings of the international symposium.  pp.186-192,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-30
2.

Technical Paper
Technical Paper
2. Sampling-Based RBDO Using Score Function with Re-Weighting Scheme.
Lin, S-P. ; Shi, L.
Pub. info.: 2013 SAE world congress : technical paper.  2013.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2013