1.

Conference Proceedings
Conference Proceedings
1. Real-world impacts of inverse lithography technology [5992-72]
Ho, J. ; Wang, Y. ; Wu, X. ; Xilinx Inc. (USA) ; Lin, B. ; Shieh, M. F. ; Sun, J. ; Lin, O. ; Lin, J. ; Liu, Y. ; Pang, L.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.59921Z-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
2.

Conference Proceedings
Conference Proceedings
2. FEC assembly at ingress node in labeled optical burst switching system [6353-23]
Xu, Y. ; Wu, J. ; Xu, K. ; Lin, J.
Pub. info.: Optical Transmission, Switching, and Subsystems IV.  pp.63530L-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6353
3.

Conference Proceedings
Conference Proceedings
3. Application of CPL mask for whole chip 5nm DRAM patterning [5853-69]
Lin, 0. ; Hung, R. ; Lee, B. ; Wu, Y.-H. ; Kozuma, M. ; Shih, C.-L. ; Lin, J. ; Hsu, M. ; Hsu, S. D.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.835-843,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853
4.

Conference Proceedings
Conference Proceedings
4. Effects of mask bias on the mask error enhancement factor (MEEF) for low k1 lithography process [5853-61]
Chang, Y. Y. ; Wu, Y.-H. ; Shih, C.-L. ; Lin, J. ; Kan, F. ; Lin, J.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.757-766,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853
5.

Conference Proceedings
Conference Proceedings
5. STUDY OF SITOX PROCESS AND ITS APPLICATION TO ADVANCED MOS DEVICES
Lin, J. ; Chen, W. ; Banerjee, S. ; Lee, J. ; Teng, C. ; Magee, C.
Pub. info.: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.623-628,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 260
6.

Conference Proceedings
Conference Proceedings
6. THERMAL STABILITY OF COBALT DISILICIDE FOR SELF-ALIGNED SILICIDE APPLICATIONS
Chen, W. ; Lin, J. ; Banerjee, S. ; Lee, J.
Pub. info.: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.163-168,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 260
7.

Conference Proceedings
Conference Proceedings
7. Actinic EUVL mask blank defect inspection by EUV photoelectron microscopy [6151-73]
Kleineberg, U. ; Lin, J. ; Neuhaeusler, U. ; Heinzmann, U. ; Weber, N. ; Escher, M ; Merkel, M. ; Oelsner, A. ; Valsaitsev, D. ; Schoenhense, G.
Pub. info.: Emerging Lithographic Technologies X.  pp.615120-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6151
8.

Conference Proceedings
Conference Proceedings
8. Inverse lithography technology at chip scale [6154-41]
Lin, B. ; Shieh, M. F. ; Sun, J. ; Ho, J. ; Wang, Y. ; Wu, X. ; Leitermann, W. ; Lin, O. ; Lin, J. ; Liu, Y. ; Pang, L.
Pub. info.: Optical Microlithography XIX.  pp.615414-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
9.

Conference Proceedings
Conference Proceedings
9. Stress Evolution During the Early Stages of AlN Vapor Growth
Wu, B. ; Bai, J. ; Tassev,, V. L. ; Lal Nakarmi M. ; Sun, W. ; Huang, X. ; Dudley, M. ; Zhang, H. ; Bliss, D. F. ; Lin, J. ; Jiang, H. ; Yang, J. ; Asif Kahn, M.
Pub. info.: GaN, AlN, InN and related materials : symposium held November 28-December 2, 2005, Boston, Massachusetts, U.S.A..  pp.653-658,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 892
10.

Conference Proceedings
Conference Proceedings
10. Simultaneously all-optical inberted and noninverted wavelength conversion employing SOA-based Sagnac interferometer [6351-125]
Chen, Z. ; Wu, J. ; Xu, K. ; Lin, J.
Pub. info.: Passive Components and Fiber-based Devices III.  pp.63513C-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6351