1.

Conference Proceedings

Conference Proceedings
Liang,Z. ; Xu,J. ; Chen,X.
Pub. info.: Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA.  pp.410-416,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4366
2.

Conference Proceedings

Conference Proceedings
Zhang,J. ; Liang,Z. ; Ming,H. ; Xia,Y. ; Long,Y. ; Xie,J. ; Zhang,Q. ; Shen,W.
Pub. info.: Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China.  pp.167-170,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4085
3.

Conference Proceedings

Conference Proceedings
Kong,F.L. ; Liang,Z. ; Lee,G.C.
Pub. info.: Proceedings of the 14th International Modal Analysis Conference February 12-15, 1996 Hyatt Regency Dearborn Hotel Dearborn, Michigan.  pp.717-724,  1996.  Bethel, CT.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2768
4.

Conference Proceedings

Conference Proceedings
Kong,F.L. ; Liang,Z. ; Lee,G.C.
Pub. info.: Proceedings of the 14th International Modal Analysis Conference February 12-15, 1996 Hyatt Regency Dearborn Hotel Dearborn, Michigan.  pp.709-716,  1996.  Bethel, CT.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2768
5.

Conference Proceedings

Conference Proceedings
Chen,D. ; Li,B. ; Huang,W. ; Liang,Z.
Pub. info.: Medical imaging 2000 : physiology and function from multidimensional images, 13-15 February 2000, San Diego, California.  pp.146-152,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3978
6.

Conference Proceedings

Conference Proceedings
Wan,M. ; Li,W. ; Kreeger,K. ; Bitter,I. ; Kaufman,A.E. ; Liang,Z. ; Chen,D. ; Wax,M.
Pub. info.: Medical imaging 2000 : physiology and function from multidimensional images, 13-15 February 2000, San Diego, California.  pp.165-171,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3978
7.

Conference Proceedings

Conference Proceedings
Tong,M. ; Lee,G.C. ; Liang,Z.
Pub. info.: Smart structures and materials 1996 : smart structures and integrated systems.  pp.619-630,  1996.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2717
8.

Conference Proceedings

Conference Proceedings
Ruan,S. ; Liang,Z. ; Lee,G.C.
Pub. info.: Proceedings of the 15th International Modal Analysis Conference February 3-6, 1997 Sheraton World Resort Orlando, Florida.  Part 1  pp.725-731,  1997.  Bethel, CT.  Society for Experimental Mechanics
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3089
9.

Conference Proceedings

Conference Proceedings
Wan,H. ; Liang,Z. ; Zhang,Q. ; Su,X.
Pub. info.: Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China.  pp.2-10,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2894
10.

Conference Proceedings

Conference Proceedings
Sun,X. ; Ming,H. ; An,W. ; Duan,L. ; Liang,Z. ; Xie,J.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.296-300,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221