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16 results

Conference Proceedings

1. Influence of Ni Excess on Structure and Shape-Memory Effect of Polycrystalline Ni2MnGa Alloys

Liang, T. ; Jiang, C.B. ; Feng, G. ; Gong, S.K. ; Xu, H.B.

Pub. info.:	Shape memory materials and its applications : proceedings of the International Conference on Shape Memory and Superelastic Technologies and Shape Memory Materials (SMST-SMM 2001), held in Kunming, China, September 2 to 6 2001. pp.561-564, 2002. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	394-395

Technical Paper

2. 3-D navier-stokes simulation of turbulent afterbody/nozzle flows

Hamed, A. ; Yeuan, J.J. ; Liang, T.

Pub. info.:	AIAA paper. pp.1-10, 1998. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:	1998

Technical Paper

3. Viscous flow simulations in a transonic fan using ｦﾊ-ｦﾅ and algebraic turbulence models

Yeuan, J.J. ; Liang, T. ; Hamed, A.

Pub. info.:	AIAA paper. pp.1-11, 1998. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:	1998

Technical Paper

4. A 3-D Navier-Stokes solver for turbomachinery blade rows

Yeuan, J.J. ; Liang, T. ; Hamed, A.

Pub. info.:	AIAA paper. pp.1-14, 1996. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.:	1996

Technical Paper

5. Three-dimensional Navier-Stokes computations of transonic fan flow using an implicit solver

Liang, T. ; Yeuan, J.J.

Pub. info.:	AIAA paper. pp.1-10, 1997. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:	1997

Conference Proceedings

6. Evaluation of the capability of a multibeam confocal inspection system for inspection of EUVL mask blanks

Stivers, A.R. ; Liang, T. ; Penn, M.J. ; Lieberman, B. ; Shelden, G.V. ; Folta, J.A. ; Larson, C.C. ; Mirkarimi, P.B. ; Walton, C.C. ; Gulliksong, E.M. ; Yi, M.

Pub. info.:	22nd Annual BACUS Symposium on Photomask Technology. Part One pp.408-417, 2002. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4889

Conference Proceedings

7. Pattern inspection of EUV masks using DUV light

Liang, T. ; Tejnil, E. ; Stivers, A.R.

Pub. info.:	22nd Annual BACUS Symposium on Photomask Technology. Part Two pp.1065-1072, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4889

Conference Proceedings

8. Use of nanomachining for subtractive repair of EUV and other challenging mask defects

Brinkley, D. ; White, R. ; Bozak, R. ; Liang, T. ; Liu, G.

Pub. info.:	Photomask and Next-Generation Lithography Mask Technology IX. pp.900-911, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4754

Conference Proceedings

9. E-beam mask repair: fundamental capability and applications

Liang, T. ; Frendberg, E. ; Bald, D. J. ; Penn, M. ; Stivers, A. R.

Pub. info.:	24th Annual BACUS Symposium on Photomask Technology. pp.456-466, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5567

10.

Conference Proceedings

10. Inspection of EUV reticles

Pettibone, D.W. ; Veldman, A. ; Liang, T. ; Stivers, A.R. ; Mangat, P.J. ; Lu, B. ; Hector, S.D. ; Wasson, J.R. ; Bleadel, K.L. ; Fisch, E. ; Walker, D.M.

Pub. info.:	Emerging Lithographic Technologies VI. Part One pp.363-374, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4688

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