1.

Conference Proceedings
Conference Proceedings
1. Strain Characterization of Hg1-xFexSe-Layers by Electron Spin Resonance
Hendorfer,G. ; Jantsch,W. ; Helzel,W. ; Li,J.H. ; Wilamowski,Z. ; Widmer,T. ; Schikora,D. ; Lischka,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.561-566,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. High Resolution Transmission Electron Microscope Investigations of Phases,Domains and Interfaces in Ti50.5Al46.5Cr3/TiB2 Composites
Ning,X.G. ; Wilkinson,D.S. ; Mao,J.F. ; Li,J.H. ; Ye,H.Q. ; Pu,Z.J. ; Zou,D.X.
Pub. info.: Intergranular and interphase boundaries in materials : iib95 : proceedings of the 7th International Conference on Intergranular and Interphase Boundaries in Materials held in Lisboa, Portugal, June 26-29, 1995.  pp.313-316,  1996.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 207-209