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12 results

Conference Proceedings

1. * PHOTOCARRIER TRANSPORT AND RECOMBINATION IN AMORPHOUS SILICON

Wronski, C.R. ; Dawson, R.M. ; Gunes, M. ; Li, Y.M. ; Collins, R.W.

Pub. info.:	Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.. pp.443-454, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	297

Conference Proceedings

2. SUB-SURFACE EQUILIBRATION OF HYDROGEN WITH THE a-Si:H NETWORK UNDER FILM GROWTH CONDITIONS

An, I. ; Li, Y.M. ; Wronski, C.R. ; Collins, R.W.

Pub. info.:	Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.. pp.43-48, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	297

Conference Proceedings

3. Laser direct forming of metal components: technical characterizations

Li, Y.M. ; Yang, H. ; Lin, X. ; Huang, W.D. ; Li, J.G. ; Zhou, Y.H.

Pub. info.:	Lasers in material processing and manufacturing : 16-18 October 2002, Shanghai, China. pp.395-402, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4915

Conference Proceedings

4. EXPERIMENTAL DETERMINATION OF THE DARK FERMI LEVEL IN HYDROGENATED AMORPHOUS SILICON

Dawson, R.M. ; Nag, S. ; Gunes, M. ; Wronski, C.R. ; Bennett, M. ; Li, Y.M.

Pub. info.:	Amorphous silicon technology, 1992. pp.747-752, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	258

Conference Proceedings

5. OPTOELECTRONIC PROPERTIES OF PLASMA CVD a-Si:H MODIFIED BY FILAMENT-GENERATED ATOMIC H

Li, Y.M. ; An, I. ; Gunes, M. ; Dawson, R.M. ; Collins, R.W. ; Wronski, C.R.

Pub. info.:	Amorphous silicon technology, 1992. pp.57-62, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	258

Conference Proceedings

6. THE MECHANISM FOR DEFECT GENERATION STUDIED BY PHOTODEGRADATION OF a-Si:H SOLAR CELLS UNDER ELECTRICAL BIAS

Yang, L. ; Chen, L. ; Hou, J.Y. ; Li, Y.M.

Pub. info.:	Amorphous silicon technology, 1992. pp.365-370, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	258

Conference Proceedings

7. OPTICAL PROPERTIES OF HYDROGENATED AMORPHOUS SILICON, SILICON-GERMANIUM AND SILICON-CARBON THIN FILMS

Dawson, R.M. ; Li, Y.M. ; Gunes, M. ; Heller, D. ; Nag, S. ; Collins, R.W. ; Wronski, C.R. ; Bennett, M. ; Li, Y.-M.

Pub. info.:	Amorphous silicon technology, 1992. pp.595-600, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	258

Conference Proceedings

8. Low-temperature blackbodies and facility for calibration of them

Morozova, S.P. ; Morozov, P.A. ; Sapritsky, V.I. ; Lisiansky, B.E. ; Dovgilov, N.L. ; Liang, Y.X. ; Li, Y.M. ; Yue, W.L.

Pub. info.:	Optical design and testing : 15-18 October 2002, Shanghai, China. pp.118-124, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4927

Conference Proceedings

9. Comparison of trap stiffness between a solid-mode optical trap and a donut-mode optical trap

Chen, H.T. ; Gong, Z. ; Li, Y.M. ; Lou, L.R. ; Zhang, D. ; Yin, L.H.

Pub. info.:	Optical design and testing : 15-18 October 2002, Shanghai, China. pp.333-339, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4927

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Conference Proceedings

10. Single-molecule detection system of optical tweezers

Chen, H.T. ; Li, Y.M. ; Lou, L.R. ; Gong, Z.

Pub. info.:	Nano-Optics and Nano-Structures. pp.98-105, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4923

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Author: Li, Y.M.