1.

Conference Proceedings
Conference Proceedings
1. *SURFACE MICROSTRUCTURAL EVOLUTION OF ULTRATHIN FILMS BY REAL TIME SPECTROSCOPIC ELLIPSOMETRY
Collins, R. W. ; An, Ilsin ; Li, Y. M. ; Wronski, C. R.
Pub. info.: Interface dynamics and growth : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.235-242,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 237
2.

Conference Proceedings
Conference Proceedings
2. EFFECTS OF INTERFACES ON THE a-Si:H SCHOTTKY BARRIER CHARACTERISTICS
Li, Y. M. ; Malone, C. ; Kumar, S. ; Wronski, C. R. ; Nguyen, H. V. ; Collins, R W.
Pub. info.: Amorphous silicon technology, 1990 : symposium held April 17-20, 1990, San Francisco, California, U.S.A..  pp.219-224,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 192
3.

Conference Proceedings
Conference Proceedings
3. Information entropy method for measuring the axial displacement of a bead and its application to analyzing the trapping force of optical trap
Bao, J. H. ; Li, Y. M. ; Lou, L. R. ; Gong, Z. ; Wang, Z. ; Wang, H. W.
Pub. info.: Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China.  pp.305-312,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5637