1.

Conference Proceedings
Conference Proceedings
1. Damage Localization in Plates Using DLVs
Bernal,D. ; Levy,A.
Pub. info.: Proceedings of the IMAC-XIX : a conference on structural dynamics, February 5-8, 2001, Hyatt Orlando Kissimmee, Florida.  4359  pp.1205-1211,  2001.  Bethel, CT.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4359
2.

Technical Paper
Technical Paper
2. Regenerative Fuel Cell Study for Satellites in GEO Orbit
Dine,L.Van ; Gonzalez-Sanabria,O. ; Levy,A.
Pub. info.: 22nd Intersociety Energy Conversion Engineering Conference : energy - new frontiers : Philadelphia, Pennsylvania, August 10-14, 1987.  pp.797-802,  1987.  "Society of Automotive Engineering, Inc."
Title of ser.: SAE publication
Ser. no.: P-198
3.

Conference Proceedings
Conference Proceedings
3. Comparison of defect detection schemes using rigorous 3D EM field simulations
Swecker,A.L. ; Strojwas,A.J. ; Levy,A. ; Bell,B.R.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XI.  pp.313-321,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3050
4.

Conference Proceedings
Conference Proceedings
4. Influence of enhanced visual processing (EVP) of chest images on workflow
Krupinski,E.A. ; Radvany,M. ; Levy,A. ; Ballenger,D. ; Tucker,J.E. ; Chacko,A.K. ; VanMetter,R.L.
Pub. info.: Medical Imaging 2001: Image Perception and Performance.  pp.77-81,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4324
5.

Conference Proceedings
Conference Proceedings
5. Microeconomics of 300-mm process module control
Monahan,K.M. ; Chatterjee,A.K. ; Falessi,G. ; Levy,A. ; Stoller,M.D.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XV.  pp.530-543,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4344
6.

Conference Proceedings
Conference Proceedings
6. Implementation of spectroscopic critical dimension (SCD) (TM) for gate CD control and stepper characterization
Allgair,J.A. ; Benoit,D.C. ; Drew,M. ; Hershey,R.R. ; Litt,L.C. ; Herrera,P.P. ; Whitney,U.K. ; Guevremont,M. ; Levy,A. ; Lakkapragada,S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XV.  pp.462-471,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4344