Sandner, T. ; Schmidt, J. U. ; Schnenk, H. ; Lakner, H. ; Yang, M. ; Gatto, A. ; Kaiser, N. ; Braun, S. ; Foltyn, T. ; Leson, A.
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Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.596314-596314, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Foltyn, Th. ; Braun, S. ; Friedrich, W. ; Leson, A. ; Menzel, M.
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Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.59632C-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.124-133, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gawlitza, P. ; Braun, S. ; Lipfert, S. ; Leson, A.
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Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA. pp.63170G-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Foltyn, Th. ; Bergmann, K. ; Braun, S. ; Gawlitza, P. ; Leson, A. ; Neff, W. ; Walter, K.
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Advances in mirror technology for X-ray, EUV lithography, laser, and other applications II : 5 August 2004, Denver, Colorado, USA. pp.37-46, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Braun, S. ; Bendjus, B. ; Foltyn, T. ; Menzel, M. ; Schreiber, J. ; Leson, A.
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Advances in mirror technology for X-ray, EUV lithography, laser, and other applications II : 5 August 2004, Denver, Colorado, USA. pp.75-84, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Loyen, L. ; Boettger, T. ; Braun, S. ; Mai, H. ; Leson, A. ; Scholze, F. ; Tuemmler, J. ; Ulm, G. ; Legall, H. ; Nickles, P.V. ; Sandner, W. ; Stiel, H. ; Rempel, C.E. ; Schulze, M. ; Brutscher, J. ; Macco, F. ; Muellender, S.
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Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.12-21, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering