1.

Conference Proceedings
Conference Proceedings
1. Micro-Raman and Electron Microscopy Analysis of Cubic GaN Layers on(001)GaAs
Tabata,A. ; Enderlein,R. ; Lima,A.P. ; Leite,J.R. ; Lemos,V. ; Kaiser,S. ; Schikora,D. ; Schottker,B. ; Kohler,U. ; Lischka,K.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1367-1370,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
2.

Conference Proceedings
Conference Proceedings
2. Theoretical interpretation of EPR measurements on the iron-shallow acceptor pairs in silicon
Assali,L.V.C. ; Leite,J.R.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.143-148,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings
Conference Proceedings
3. Group-? Impurity Related Centers in GaAs
Gomes,V.M.S. ; Pintanel,R. ; Scolfaro,L.M.R. ; Leite,J.R. ; Menezes,E.A.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.833-838,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
4.

Conference Proceedings
Conference Proceedings
4. Surface Reconstruction and MBE Growth of Cubic GaN on(001)GaAs:A Total Energy Study
Silva,J.L.F.da ; Enderlein,R. ; Scolfaro,L.M.R. ; Leite,J.R. ; Tabata,A. ; Lischka,K. ; Schikora,D. ; Bechstedt,F.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1197-1200,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
5.

Conference Proceedings
Conference Proceedings
5. Green's-Function Calculation of the Formation Entropy of a Vacancy in Silicon
Leite,J.R. ; Silva,E.C.F.da ; Pino,A.Dal,Jr.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.263-268,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
6.

Conference Proceedings
Conference Proceedings
6. Electronic States of n-type ｦﾄ-Doping in GaAs Heterostructures
Scolfaro,L.M.R. ; Leite,J.R. ; Mendonca,C.A.C. ; Beliaev,D. ; Shibli,S.M. ; Silva,E.C.F.Da ; Meneses,E.A.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.669-673,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
7.

Conference Proceedings
Conference Proceedings
7. Electronic structure of transition-metal impurities in Ga-As1-xPx-Px alloys
Pintanel,R. ; Scolfaro,L.M.R. ; Leite,J.R.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.707-712,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
8.

Conference Proceedings
Conference Proceedings
8. Bistability of Iron-Group ? Acceptor Pairs in Silicon
Assali,L.V.C. ; Leite,J.R.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.409-414,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
9.

Conference Proceedings
Conference Proceedings
9. Electronic states of Fe4 and Mn4 clusters in silicon
Leite,J.R. ; Assali,L.V.C. ; Lino,A.T.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.221-226,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87