1.

Conference Proceedings

Conference Proceedings
Klaas,U. ; Lemke,D. ; Kranz,T. ; Laureijs,R.J. ; Leinert,C. ; Schubert,J. ; Stickel,M. ; Toth,L.V.
Pub. info.: Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii.  Part 2  pp.996-1004,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3354
2.

Conference Proceedings

Conference Proceedings
Richichi,A. ; Leinert,C.
Pub. info.: Interferometry in optical astronomy : 27 - 29 March 2000 Munich, Germany.  Part1  pp.289-298,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4006
3.

Conference Proceedings

Conference Proceedings
Leinert,C. ; Graser,U. ; Waters,L.B.F.M. ; Perrin,G. ; Lopez,B. ; Foresto,V.Coude du ; Glazenborg-Kluttig,A.W. ; Haas,J.C.M.de ; Herbst,T.M. ; Jaffe,W. ; Lena,P.J. ; Lenzen,R. ; Poole,R.S.Le ; Ligori,S. ; Pel,J.-W. ; I.L.Porro; ; Luhe,O.von der
Pub. info.: Interferometry in optical astronomy : 27 - 29 March 2000 Munich, Germany.  Part1  pp.43-53,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4006
4.

Conference Proceedings

Conference Proceedings
Lopez,B. ; Leinert,C. ; Graser,U. ; Waters,L.B.F.M. ; Perrin,G. ; Herbst,T.M. ; Rottgering,H.J.A. ; Rouan,D. ; Stecklum,B. ; Mundt,R. ; Zinnecker,H. ; Laverny,P.de ; Feldt,M. ; Meisner,J.A. ; Henning,T. ; Vakili,F.
Pub. info.: Interferometry in optical astronomy : 27 - 29 March 2000 Munich, Germany.  Part1  pp.54-67,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4006
5.

Conference Proceedings

Conference Proceedings
Leinert,C. ; Graser,U.
Pub. info.: Astronomical Interferometry : 20-24 March 1998, Kona, Hawaii.  Part 1  pp.389-393,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3350