Smart structures and materials 2000 : mathematics and control in smart structures : 6-9 March, 2000, Newport Beach, USA. pp.425-436, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA. Part2 pp.780-787, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA. Part2 pp.926-934, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.764-772, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 15th International Modal Analysis Conference February 3-6, 1997 Sheraton World Resort Orlando, Florida. Part 1 pp.432-437, 1997. Bethel, CT. Society for Experimental Mechanics
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Proceedings of SPIE - the International Society for Optical Engineering
Optical devices for fiber communication II : 6-8 November 2000 Boston, USA. pp.174-181, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France. Part2 pp.854-862, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic components and optical communication : 4-5 November 1996, Beijing, China. pp.441-448, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering