Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA. pp.933-944, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA. pp.963-972, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA. pp.953-962, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Image processing : algorithms and systems III : 19-21 January 2004, San Jose, California, USA. pp.475-482, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Chen, C.-J. ; Lai, S.-H. ; Lee, W.-H. ; Lin, C.-Y. ; Ku, T. ; Chen, C.-H. ; Chung, Y.-C.
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Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.600008-600008, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Novel optical systems design and optimization VI : 4 August 2003, San Diego, California, USA. pp.128-135, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Gader, P.D. ; Wilson, J.N. ; Wang, T. ; Keller, J.M. ; Lee, W.-H. ; Grandhi, R. ; Hocaoglu, A.K. ; McElroy, J.
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Detection and Remediation Technologies for Mines and Minelike Targets VIII. 2 pp.1307-1315, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering