1.

Conference Proceedings
Conference Proceedings
1. Precision control of poly-gate CD by local OPC for elimination of microloading effect on 0.13-μm CMOS technology
Lee, T.-K. ; Wang, Y.-C. ; Chi, M. ; Lu, C.Y. ; Hsieh, C.H. ; Liu, R.G. ; Liao, H.J. ; Yang, S.S. ; Chang, C.-H.
Pub. info.: Design and process integration for microelectronic manufacturing II : 26-28 February 2003, Santa Clara, California, USA.  pp.346-352,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5042
2.

Technical Paper
Technical Paper
2. Turbulence Intensity Calculation from Cylinder Pressure Data in a High Degree of Freedom Spark-Ignition Engine.
Prucka, R.G. ; Lee, T.-K.
Pub. info.: 2010 SAE world congress : technical paper.  2010.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2010
3.

Technical Paper
Technical Paper
3. Nonlinear Model Predictive Control of Advanced Engines Using Discretized Nonlinear Control Oriented Models.
Lee, T.-K. ; Filipi, Z.
Pub. info.: 2010 SAE Powertrains Fuels & Lubricants Meeting : technical paper.  2010.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2010
4.

Technical Paper
Technical Paper
4. Simulation Based Assessment of Plug-in Hybrid Electric Vehicle Behavior During Real-World 24-Hour Missions.
Lee, T.-K. ; Filipi, Z.
Pub. info.: 2010 SAE world congress : technical paper.  2010.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2010
5.

Conference Proceedings
Conference Proceedings
5. Precision control of poly-gate CD by local OPC for elimination of microloading effect on 0.13-μm CMOS technology
Lee, T.-K. ; Wang, Y.-C. ; Chi, M.-H. ; Lu, C.Y. ; Hsieh, C.H. ; Liu, R.G. ; Liao, H.J. ; Yang, S.S. ; Chang, C.-H.
Pub. info.: Optical Microlithography XVI.  Part One  pp.450-456,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5040
6.

Conference Proceedings
Conference Proceedings
6. Pecision control of poly-gate CD by local OPC for elimination of microloading effect on 0.13-Цm CMOS technology
Lee, T.-K. ; Wang, Y.-C. ; Chi, M.-H. ; Lu, C.Y. ; Hsieh, C.H. ; Liu, R.G. ; Liao, H.J. ; Yang, S.S. ; Chang, C.-H.
Pub. info.: Optical Microlithography XVI.  Part One  pp.450-456,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5040