van Noort, D. ; Lee, I.-H. ; Landweber, L. F. ; Zhang, B.-T.
Pub. info.:
Biomedical applications of micro- and nanoengineering II : 13-15 December 2004, Sydney, Australia. pp.28-34, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jeon, B.-T. ; Kim, O.-H. ; Baik, J.-H. ; Ha, J.-H. ; Lee, I.-H. ; Yang, W.-S.
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Metrology, Inspection, and Process Control for Microlithography XIX. pp.140-143, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.753-760, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering