Progress on advanced manufacture for micro/nano technology 2005 : proceedings of the 2005 International Conference on Advanced Manufacture Taipei, Taiwan, R.O.C. November 28th-December 2nd, 2005. pp.1-6, 2006. Uetikon-Zuerich. Trans Tech Publications
Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA. pp.251-261, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Risk, reliability, and security : Center for Chemical Process Safety 17th International Conference and Workshop : October 8-11 2002, Adam's Mark Jacksonville, Jacksonville, Florida. pp.533-544, 2002. New York. American Institute of Chemical Engineers
Shin, S.R. ; Park, S.J. ; Yoon, S.G. ; Lee, C.K. ; Kim, I.Y. ; Kim, S.I. ; Kim, S.J.
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Smart structures and materials 2004 : electroactive polymer actuators and devices (EAPAD) : 15-18 March 2004, San Diego, California, USA. pp.490-499, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Kim, Y.J. ; Noh, Y.M. ; Choi, S.C. ; Lee, C.K. ; Jung, J.S. ; Lee, H.L. ; Kim, J.E. ; Kim, K.W. ; Kim, M.J. ; He, Z. ; Ogunjobi, K. ; Lee, K.H.
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Remote sensing in atmospheric pollution monitoring and control : 2 August 2004, Denver, Colorado, USA. pp.134-143, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2003 : Industrial and commercial applications of smart structures technologies : 4-6 March 2003, San Diego, California, USA. pp.1-15, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering