1.

Conference Proceedings
Conference Proceedings
1. 67 High Spatial Resolution Mapping of Strain Induced by the Geometry Configuration in Nanoscaled Devices
Toh, S.L. ; Loh, K.P. ; See, K.S. ; Boothroyd, O.B. ; Li, K. ; Lau, W.S. ; Ang, C.H. ; Chan, L.
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium.  pp.562-568,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-05
2.

Conference Proceedings
Conference Proceedings
2. Efficient Detection of Oxygen Vacancy Double Donors in Capacitors with Ultra-Thin Ta2O5 Films for DRAM Applications by Zero-Bias Thermally Stimulated Current Spectroscopy
Lau, W.S. ; Zhong, L. ; Han, Taejoon ; Sandler, Nathan P.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.99-104,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
3.

Conference Proceedings
Conference Proceedings
3. Various Methods to Reduce Defect States in Tantalum Oxide Films for DRAM Applications
Lau, W.S. ; Zhang, G. ; Leong, L.L. ; Han, Taejoon ; Das, J. ; Sandler, Nathan P. ; Chu, P.K.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.181-188,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
4.

Technical Paper
Technical Paper
4. A low-cost wireframe-to-solid implementation for reverse engineering
Shum, Simon S.P. ; Yu, K.M. ; Lau, W.S. ; Yuen, Matthew M.F.
Pub. info.: SME technical paper series.  pp.1P-,  1998.  Society of Manufacturing Engineers