Quesnel, E. ; Largeron, C. ; Muffato, V. ; Hodaj, F. ; Thibault, J.
Pub. info.:
Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.59631L-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Badano, G. ; Baliet, P. ; Zanatta, J. P. ; Millon, A. ; Largeron, C. ; Baylet, J. ; Rothman, J. ; Gravrand, O. ; Castelein, P. ; Chamonal, J. P. ; Destefanis, G.
Pub. info.:
Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.596406-596406, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering