1.

Conference Proceedings
Conference Proceedings
1. The Antarctic planet interferometer
Swain, M. R. ; Walker, C. K. ; Traub, W. A. ; Storey, J. W. V. ; Foresto, V. Coude du ; Fossat, E. ; Vakili, F. ; Stark, A. A. ; Lloyd, J. P. ; Lawson, P. R. ; Burrows, A. S. ; Ireland, M. ; Millan-Gabet, R. ; Belle, G. T. van ; Lane, B. ; Vasisht, G. ; Travouillon, T.
Pub. info.: New frontiers in stellar interferometry : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.176-185,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5491
2.

Conference Proceedings
Conference Proceedings
2. Temperature Compensation of PMOS Dosimeters
O'Sullivan, M. ; Kelleher, A. ; Ryan, J. ; O'Neill, B. ; Lane, B.
Pub. info.: Proceedings of the ESA Electronic Components Conference, held at the Conference Centre, ESTEC, Noordwijk, the Netherlands, 12-16 November 1990.  pp.281-286,  1991.  Paris.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 313
3.

Conference Proceedings
Conference Proceedings
3. The GMT ground-layer AO experiment at the Magellan telescopes
Athey, A. E. ; Shectman, S. ; Schechter, P. ; Lane, B.
Pub. info.: Advancements in adaptive optics : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.960-965,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5490
4.

Conference Proceedings
Conference Proceedings
4. High-Power InAsSb/InAsSbP Laser Diodes Emitting at 3｡ﾁ5 ｦﾌm Range
Razeghi, M. ; Diaz, J. ; Yi, H-J. ; Wu, D. ; Lane, B. ; Rybaltowski, A. ; Xiao, Y. ; Jeon, H.
Pub. info.: Infrared applications of semiconductors - materials, processing, and devices : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A.  pp.13-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 450
5.

Conference Proceedings
Conference Proceedings
5. Optimization of a Low Damage, High Resolution SiNx Etch Process in an Electron Cyclotron Resonance (ECR) Reactor with Multipolar Confinement
Olson, R.J. ; Kazior, T.E., Jr. ; Lane, B. ; Holber, W.M. ; Bourget, L.
Pub. info.: Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII).  pp.252-261,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-6
6.

Conference Proceedings
Conference Proceedings
6. Wafer level inspection for determination of yield of surface-micromachined pressure sensors
Hill, M. ; Berney, H. ; Lane, B. ; Hynes, E.
Pub. info.: Microsystems Metrology and Inspection.  pp.16-23,  1999.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3825