1.

Conference Proceedings

Conference Proceedings
Hug, W. F. ; Bhartia, R. ; Tsapin, A. ; Lane, A. ; Conrad, P. ; Sijapati, K. ; Reid, R. D.
Pub. info.: Chemical and biological sensors for industrial and environmental monitoring II : 3-4 October, 2006, Boston, Massachusetts, USA.  pp.63780S-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6378
2.

Conference Proceedings

Conference Proceedings
Hug, W. F. ; Bhartia, R. ; Taspin, A. ; Lane, A. ; Conrad, P. ; Sijapati, K. ; Reid, R. D.
Pub. info.: Chemical and biological sensors for industrial and environmental security : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.59940J-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5994
3.

Conference Proceedings

Conference Proceedings
Beck, S.E. ; Bohling, D.A. ; Felker, B.S. ; George, M.A. ; Gilicinski, A.G. ; Ivankovits, J.V. ; Langan, J.G. ; Rynders, S.W. ; Norman, J.A.T. ; Roberts, D.A. ; Voloshin, G. ; Hess, D.M. ; Lane, A.
Pub. info.: Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.253-263,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-7
4.

Conference Proceedings

Conference Proceedings
Gerecht, E. ; Yngvesson, S. ; Nicholson, J. ; Zhuang, Y. ; Rodriguez-Morales, F. ; Zhao, X. ; Gu, D. ; Zannoni, R. ; Coulombe, M.J. ; Dickinson, J.C. ; Goyette, T.M. ; Waldman, J. ; Groppi, C.E. ; Hedden, A.S. ; Golish, D. ; Walker, C.K. ; Stark, A.A. ; Martin, C. ; Lane, A.
Pub. info.: Millimeter and submillimeter detectors for astronomy : 25-28 August 2002, Waikoloa, Hawaii, USA.  pp.574-582,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4855