1.

Conference Proceedings

Conference Proceedings
Delcroix,G. ; Aluze,D. ; Merienne,F. ; Lamalle,B. ; Gorria,P.
Pub. info.: Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California.  pp.34-42,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3652
2.

Conference Proceedings

Conference Proceedings
Lamalle,B. ; Gorria,P. ; Voon,L.F.C.L.Y. ; Cathebras,G.
Pub. info.: Optical diagnostics for industrial applications : 22-24 May 2000, Glasgow, Scotland, United Kingdom.  pp.225-234,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4076
3.

Conference Proceedings

Conference Proceedings
Voon,L.F.C.L.Y. ; Cathebras,G. ; Bellach,B. ; Lamalle,B. ; Gorria,P.
Pub. info.: Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA.  pp.168-177,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4306
4.

Conference Proceedings

Conference Proceedings
Coulot,C. ; Kohler-Hemmerlin,S. ; Dumont,C. ; Aluze,D. ; Lamalle,B.
Pub. info.: Machine Vision Applications in Industrial Inspection V.  pp.69-77,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3029