1.

Conference Proceedings
Conference Proceedings
1. DETERMINATION OF THE FORMATION OF THE 1/6[031] EXTRINSIC STACKING FAULTS IN DEFORMED YBa2Cu3O7-δ
Kramer, M. J. ; Kvam, E. P. ; Chumbley, L. S.
Pub. info.: High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA.  pp.375-380,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 183
2.

Conference Proceedings
Conference Proceedings
2. THE NUCLEATION AND PROPAGATION OF MISFIT DISLOCATIONS NEAR THE CRITICAL THICKNESS IN Ge-Si STRAINED EPILAYERS
Kvam, E. P. ; Eaglesham, D. J. ; Maher, D. M. ; Humphreys, C. J. ; Bean, J. C. ; Green, G. S. ; Tanner, B. K.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.623-628,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
3.

Conference Proceedings
Conference Proceedings
3. Unique Defect-Induced Donor Structure at the Lattice Mismatched InAs/GaP Heterointerface
Gopal, V. ; Chen, E-H. ; Kvam, E. P. ; Woodall, J. M.
Pub. info.: III-V and IV-IV materials and processing challenges for highly integrated microelectronics and optoelectronics : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.65-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 535
4.

Conference Proceedings
Conference Proceedings
4. Sequential operation of three distinct misfit dislocation introduction mechanisms in an epitaxial bilayer film
Gopal, V. ; Kvam, E. P. ; Chen, E-H. ; Woodall, J. M.
Pub. info.: Thin films - stresses and mechanical properties VIII : symposium held November 29-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.157-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 594
5.

Conference Proceedings
Conference Proceedings
5. Microstructural and Electrical Characterization of Misfit Dislocations at the InAs/GaP Heterointerface
Gopal, V. ; Chin, T. P. ; Vasiliev, A. L. ; Woodall, J. M. ; Kvam, E. P.
Pub. info.: Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A..  pp.63-,  1998.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 500
6.

Conference Proceedings
Conference Proceedings
6. Thermodynamics and Microstructure Development in the Thin Film Reaction of Aluminum on Silicon Carbide
Hayes, T. S. ; Ray, F. T. ; Trumble, K. P. ; Kvam, E. P.
Pub. info.: Polycrystalline thin films II : structure, properties, and applications : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.489-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 403