1.

Conference Proceedings
Conference Proceedings
1. Electron-Irradiation Induced Defects in Fe-Doped Semi-Insulating InP
Kuriyama,K. ; Sakai,K. ; Kato,T. ; Iijima,T. ; Okada,M. ; Yokoyama,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1443-1448,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Study on the Irradiation Induced Defects in 6H-SiC
Hayashi,N. ; Watanabe,H. ; Sakai,K. ; Kuriyama,K. ; Ikeda,Y. ; Maekawa,H. ; Miura,T.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1243-1248,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings
Conference Proceedings
3. Site Identification of 6H-SiC Using RBS/Channeling Technique
Satoh,M. ; Okamoto,K. ; Iwata,Y. ; Kuriyama,K. ; Kanaya,M. ; Ohtani,N.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.441-444,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268