1.

Conference Proceedings

Conference Proceedings
Schweizer, H. ; Griesinger, U. ; Gauggel, H.P. ; Hofmann, R. ; Wang, J. ; Lichtenstein, N. ; Burkard, M. ; Kuhn, J. ; Geng, C. ; Geiger, M. ; Off, J. ; Scholz, F.
Pub. info.: Proceedings of the Symposium on Light Emitting Devices for Optoelectronic Applications and the Twenty-Eighth State-of-the-Art Program on Compound Semiconductors.  pp.210-239,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-2
2.

Conference Proceedings

Conference Proceedings
Rimmele, T. R. ; Hubbard, R. P. ; Balasubramaniam, K. S. ; Berger, T. ; Elmore, D. ; Gary, G. A. ; Jennings, D. ; Keller, C. ; Kuhn, J. ; Lin, H. ; Mickey, D. ; Moretto, G. ; Socas-Navarro, H. ; Stenflo, J. O. ; Wang, H.
Pub. info.: Ground-based instrumentation for astronomy : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.932-943,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5492
3.

Conference Proceedings

Conference Proceedings
Emde, P. ; Kuhn, J. ; Weis, U. ; Bornkessel, T.
Pub. info.: Astronomical structures and mechanisms technology : 21-22 June 2004, Glasgow, Scotland, United Kingdom.  pp.238-246,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5495
4.

Conference Proceedings

Conference Proceedings
Hill, F. ; Beckers, J. ; Brandt, P. ; Briggs, J. ; Brown, T. ; Brown, W. ; Collados, M. ; Denker, C. ; Fletcher, S. ; Hegwer, S. ; Horst, T. ; Komsa, M. ; Kuhn, J. ; Lecinski, A. ; Lin, H. ; Oncley, S. ; Penn, M. ; Rimmele, T. R. ; Socas-Navarro, H. ; Streander, K.
Pub. info.: Ground-based telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.122-129,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5489
5.

Conference Proceedings

Conference Proceedings
Colomb, T. ; Kuhn, J. ; Cuche, E. ; Montfort, F. ; Marian, A. ; Aspert, N. ; Marquet, P. ; Depeursinge, C.
Pub. info.: Optical Micro- and Nanometrology in Microsystems Technology.  pp.618805-618805,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6188
6.

Conference Proceedings

Conference Proceedings
Kuhn, J. ; Cuche, E. ; Emery, Y. ; Colomb, T. ; Charriere, F. ; Montfort, F. ; Botkine, M. ; Aspert, N. ; Depeursinge, C.
Pub. info.: Optical Micro- and Nanometrology in Microsystems Technology.  pp.618804-618804,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6188
7.

Conference Proceedings

Conference Proceedings
Bartoszyk, A. ; Johnston, J. ; Kaprielian, C. ; Kuhn, J. ; Kunt, C. ; Rodini, B. ; Young, D.
Pub. info.: Optical Materials and Structures Technologies II.  pp.58680K-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5868
8.

Conference Proceedings

Conference Proceedings
Depeursinge, C. D. ; Charriere, F. ; Marian, A. M. ; Montfort, F. ; Colomb, T. ; Kuhn, J. ; Cuche, E. ; Emery, Y. ; Marquet, P. ; Magistretti, P. J.
Pub. info.: Optical Metrology in Production Engineering.  pp.504-512,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5457
9.

Conference Proceedings

Conference Proceedings
Kuhn, J. ; Broza, R. ; Verkin, E.
Pub. info.: Genetically Engineered and Optical Probes for Biomedical Applications II.  pp.153-164,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5329
10.

Conference Proceedings

Conference Proceedings
Charriere, F. ; Kuhn, J. ; Colomb, T. ; Montfort, F. ; Cuche, E. ; Emery, Y. ; Weible, K. ; Depeursinge, C. D.
Pub. info.: Optical Measurement Systems for Industrial Inspection IV.  pp.447-453,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5856