Hussein, Z.A. ; Holt, B. ; McDonald, K.C. ; Jordan, R. ; Huang, J. ; Kuga, Y. ; Ishimura, A. ; Jaruwatanadilok, S. ; Gogineni, P. ; Akins, T. ; Hearvey, B. ; Perovich, D. ; Sturm, M.
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Sensors, systems, and next-generation satellites IX : 20-22 September 2005, Bruges, Belgium. pp.59780D-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA. pp.7-14, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced signal processing algorithms, architectures, and implementations XII : 9-11 July 2002, Seattle, Washington, USA. pp.317-328, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electro-optical system design, simulation, testing, and training : 9-10 July 2002, Seattle, Washington, USA. pp.106-113, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Honda, T. ; Tsubamoto, M. ; Kuga, Y. ; Kawanishi, H.
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Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.1125-, 1998. Warrendale, Pa.. MRS - Materials Research Society
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Complex mediums III : beyond linear isotropic dielectrics : 8-10 July 2002, Seattle, [Washington] USA. pp.92-99, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Guilly, M.L. ; Xu, C. ; Cheng, V. ; Taya, M. ; Opperman, L. ; Kuga, Y.
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Smart structures and materials 2003 : Electroactive polymer actuators and devices (EAPAD) : 3-6 March 2003, San Diego, California, USA. pp.362-371, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA. pp.87-97, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA. pp.35-45, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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