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Conference Proceedings

Conference Proceedings
Hussein, Z.A. ; Holt, B. ; McDonald, K.C. ; Jordan, R. ; Huang, J. ; Kuga, Y. ; Ishimura, A. ; Jaruwatanadilok, S. ; Gogineni, P. ; Akins, T. ; Hearvey, B. ; Perovich, D. ; Sturm, M.
Pub. info.: Sensors, systems, and next-generation satellites IX : 20-22 September 2005, Bruges, Belgium.  pp.59780D-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5978
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Conference Proceedings

Conference Proceedings
Lee, S.-W. ; Ishimaru, A. ; Kuga, Y.
Pub. info.: Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA.  pp.7-14,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4780
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Conference Proceedings

Conference Proceedings
Curry, M. ; Kuga, Y.
Pub. info.: Advanced signal processing algorithms, architectures, and implementations XII : 9-11 July 2002, Seattle, Washington, USA.  pp.317-328,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4791
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Conference Proceedings

Conference Proceedings
Lee, S. ; Kuga, Y.
Pub. info.: Electro-optical system design, simulation, testing, and training : 9-10 July 2002, Seattle, Washington, USA.  pp.106-113,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4772
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Conference Proceedings

Conference Proceedings
Honda, T. ; Tsubamoto, M. ; Kuga, Y. ; Kawanishi, H.
Pub. info.: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.1125-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 482
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Conference Proceedings

Conference Proceedings
Lee, S.-W. ; Ishimaru, A. ; Kuga, Y. ; Jandhyala, V.
Pub. info.: Complex mediums III : beyond linear isotropic dielectrics : 8-10 July 2002, Seattle, [Washington] USA.  pp.92-99,  2002.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4806
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Conference Proceedings

Conference Proceedings
Liang, Y. ; Taya, M. ; Kuga, Y.
Pub. info.: Smart structures and materials 2003 : Industrial and commercial applications of smart structures technologies : 4-6 March 2003, San Diego, California, USA.  pp.45-52,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5054
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Conference Proceedings

Conference Proceedings
Guilly, M.L. ; Xu, C. ; Cheng, V. ; Taya, M. ; Opperman, L. ; Kuga, Y.
Pub. info.: Smart structures and materials 2003 : Electroactive polymer actuators and devices (EAPAD) : 3-6 March 2003, San Diego, California, USA.  pp.362-371,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5051
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Conference Proceedings

Conference Proceedings
Jaruwatanadilok, S. ; Ishimaru, A. ; Kuga, Y.
Pub. info.: Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA.  pp.87-97,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4819
10.

Conference Proceedings

Conference Proceedings
Ketprom, U. ; Kuga, Y. ; Jaruwatanadilok, S. ; Ishimaru, A.
Pub. info.: Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA.  pp.35-45,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4819